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THE STATISTIC CHARACTER OF THE SHORT-CIRCUIT CURRENTS STRESSES


NEMEƞ CIPRIAN, IVAS DUMITRU
“GH.ASACHI” TECHNICAL UNIVERSITY, IAƞI

Issue:

MOCM, Number 11, Volume IV

Section:

Electric Equipment and Devices in Energetics

Abstract:

Knowing the thermal and electro-dynamic stresses is crucial to a safe design of equipment and power system components, manufacturing and other key industries but the subject generally does not receive the proper attention in engineering probabilistic design.The magnitude of these stresses depends directly on the short-circuit currents and the fault time and indirectly on the structural system characteristic and state just prior to the fault, thetype of fault, etc. These components affecting the magnitude of the thermal and electrodynamic stresses may be assumed as random variables, so, in order to take in account these parameters in stress analysis, the probabilistic approach will be a new way to explore the engineering design.

Keywords:

thermal stress, electro-dynamic stress, probability density function.

Code [ID]:

MOCM200511V04S03A0004 [0000218]


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