Issue:

PLUMEE, Number 1, Volume I

Section:

Issue No. 1 - Volume 3(2013)
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Abstract:

In this paper we present a system allows testing and analysis of digital integrated circuits using a microcontroller in order to determine defects or functional analysis in the laboratories of university teaching. Based on input signals generated by the microcontroller, check studied logic function circuit, displaying the output status and a report on the status of the circuit.

Keywords:

digital circuit, testing and study, microcontroller.

Code [ID]:

PLUMEE201301V01S01A0003 [0003959]

Full paper:

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