MATERIALS CHARACTERIZATION USING KLYSTRON CAVITY: EXTRACTION OF THICKNESS AND DIELECTRIC PARAMETERS OF THIN LAYER
ANOUMOU APEDJINOU(1), DOMINIQUE CROS(1), VALERIE MADRANGEAS(1), DAMIEN PASSERIEUX(1), MICHEL AUBOURG(1), JEAN MICHEL LEFLOCH(2), MICHAEL EDMUND TOBAR(2)
1. XLIM, UMR CNRS n° 7252, Université de Limoges, 123 Av. A. Thomas, 87060 Limoges, France 2. School of Physics, The University of Western Australia, Crawley, WA 6009, Australia
Abstract
In Microwave field, the utilization of klystron cavity also called re-entrant cavity is interesting because of its small dimensions compared to wavelengths. The main aim of this article is to explain the working of the cavity with original coupling system using coaxial probes and its frequency response similar to piezoelectric resonators. That led us to build an equivalent circuit based on lumped elements