MATERIALS CHARACTERIZATION USING KLYSTRON CAVITY: EXTRACTION OF THICKNESS AND DIELECTRIC PARAMETERS OF THIN LAYER

  • ANOUMOU APEDJINOU
    XLIM, UMR CNRS n° 7252, Université de Limoges, 123 Av. A. Thomas, 87060 Limoges, France
  • DOMINIQUE CROS
    XLIM, UMR CNRS n° 7252, Université de Limoges, 123 Av. A. Thomas, 87060 Limoges, France
  • VALERIE MADRANGEAS
    XLIM, UMR CNRS n° 7252, Université de Limoges, 123 Av. A. Thomas, 87060 Limoges, France
  • DAMIEN PASSERIEUX
    XLIM, UMR CNRS n° 7252, Université de Limoges, 123 Av. A. Thomas, 87060 Limoges, France
  • MICHEL AUBOURG
    XLIM, UMR CNRS n° 7252, Université de Limoges, 123 Av. A. Thomas, 87060 Limoges, France
  • JEAN MICHEL LEFLOCH
    School of Physics, The University of Western Australia, Crawley, WA 6009, Australia
  • MICHAEL EDMUND TOBAR
    School of Physics, The University of Western Australia, Crawley, WA 6009, Australia

Abstract

In Microwave field, the utilization of klystron cavity also called re-entrant cavity is interesting because of its small dimensions compared to wavelengths. The main aim of this article is to explain the working of the cavity with original coupling system using coaxial probes and its frequency response similar to piezoelectric resonators. That led us to build an equivalent circuit based on lumped elements

Cuvinte cheie

passive circuits klystron re-entrant cavity material characterization