Abstract
The re-entrant cavity, or klystron cavity, is used in this application to determine the dielectric permittivity of materials. One of the advantages of this structure is that it allows a characterization at low frequencies for small sample sizes. The other important point is that this device associated with an original coupling system, leads to information that can determine both the permittivity and the thickness of the sample under test.
Cuvinte cheie
Klystron cavity
material characterization
complex permittivity